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How Semiconductor Yields Vastly Improved

21 snips
May 1, 2025
The podcast dives into the fascinating evolution of semiconductor yields, tracing the journey from abysmally low rates of around 2% in the late 1970s to impressive modern figures of 80-90%. It highlights how new automated inspection tools transformed the industry by enhancing defect detection accuracy. The discussion uncovers the struggles of human inspection, revealing the subjective challenges faced in the past. Listeners will learn about the groundbreaking advancements in wafer inspection technologies that have revolutionized chip fabrication.
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INSIGHT

Yield Improvement Through Inspection

  • Semiconductor fabs tolerated extremely low yields for decades, often below 50%.
  • Modern fabs achieve 80-90% yields due to new inspection tools and rigorous defect management.
INSIGHT

Limitations of Human Inspection

  • Human wafer inspection was inconsistent and subjective, with effectiveness never exceeding 87%.
  • Defect data varied between inspectors and sessions, impairing improvement tracking.
ANECDOTE

Bell Labs' AMIS Automated Tool

  • Bell Labs developed the first automated mask inspection tool, AMIS, using laser beams to find defects.
  • Despite limitations, AMIS's consistency enabled long-term defect tracking and process improvements.
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