Asianometry cover image

EUV Photoresists: The Next Generation?

Asianometry

00:00

Evolution and Challenges of Photoresists in Semiconductor Manufacturing

This chapter explores the evolution of photoresists in semiconductor manufacturing, focusing on the shift from chemically amplified resists to advanced materials for extreme ultraviolet lithography. It highlights the challenges posed by traditional resists and the innovative solutions being developed to enhance efficiency and resolution.

Transcript
Play full episode

The AI-powered Podcast Player

Save insights by tapping your headphones, chat with episodes, discover the best highlights - and more!
App store bannerPlay store banner
Get the app