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U.S. Semiconductor Export Controls On China Are Failing | Dylan Patel

Hidden Forces

NOTE

Complexity and Yield in Chip Manufacturing

Yield is complex in chip manufacturing due to the high level of intricacy involved. To ensure functionality, redundancy is built into chips, gradually reduced as yield improves. The industry uses a metric called D zero, representing defects per square centimeter. Defects can range from broken transistors to improperly printed wires. Yield is determined by the number of defects present.

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