Super Data Science: ML & AI Podcast with Jon Krohn cover image

875: How Semiconductors Are Made (And Fuel the AI Boom), with Kai Beckmann

Super Data Science: ML & AI Podcast with Jon Krohn

CHAPTER

The Synergy Between Metrology and AI in Chip Development

This chapter explores the vital function of high-precision metrology in the evolution of AI technology, especially in chip manufacturing. It highlights the symbiotic relationship between metrology data and AI algorithms, forming a feedback loop that fosters continuous advancements in both fields.

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